Innovation brought by ID-FAST

  • Filling the gap between ex-situ tests and aging within PEMFC for GDLs and BPP components through the development of new in-situ ASTs
  • Identification and quantification of major stressors impact (among temperature, relative humidity of reactants, ionomer water content and electrode potential) on components degradation and performance decay in single mechanism ASTs
  • Filling the gap between real aging and accelerated stress tests through the development of combined ASTs based on consortium’s knowledge on single mechanism ASTs and FC-DLC durability tests with specific stressors
  • Further development and validation of degradation models through the identification and quantification of the impact of local conditions
  • Development of performance degradation models including multi-mechanisms degradation models, based either on direct coupling or multi-scale approach, allowing to simulate ASTs as well as realistic user profiles
  • Development of a methodology to correlate ASTs in single cells to real world aging through the use of two transfer functions
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Project supported under Grant Agreement
FCH-JU GA: 779565